Temperature/humidity/low pressure comprehensive test

Test Profile:
Temperature/humidity/low pressure comprehensive test is mainly used to determine whether the product can withstand the ability to store or work in temperature/humidity/low pressure environment. Such as storage or work at high altitudes, transport or work in pressurized or unpressurized cabins of aircraft, transport outside the aircraft, exposure to rapid or explosive depressurization environments, etc.

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The main hazards of low air pressure to products are:
▪Physical or chemical effects, such as product deformation, damage or rupture, changes in physical and chemical properties of low-density materials, reduced heat transfer causes equipment to overheat, sealing failure, etc.

▪Electrical effects such as arcing causing product failure or unstable operation.

▪Environmental effects such as changes in the dielectric properties of low pressure gas and air lead to changes in the function and safety performance of test samples. At low atmospheric pressure, especially when combined with high temperatures, the dielectric strength of the air is significantly reduced, resulting in an increased risk of arcing, surface or corona discharge. Changes in material properties due to low or high temperatures increase the risk of deformation or rupture of sealed equipment or components under low air pressure.

Test Objects:
Aerospace equipment, high-altitude electronic products, electronic components or other products

Test Items:
Low pressure test, high temperature and low pressure, low temperature and low pressure, temperature/humidity/low pressure, rapid decompression test, etc.

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Test Standards:
GB/T 2423.27-2020 Environmental testing – Part 2:
Test methods and guidelines: temperature/low pressure or temperature/humidity/low pressure comprehensive test
IEC 60068-2-39:2015 Environmental testing – Part 2-39:
Test methods and guidelines: temperature/low pressure or temperature/humidity/low pressure comprehensive test
GJB 150.2A-2009 Laboratory Environmental Test Methods for Military Equipment Part 2:
Low pressure (altitude) test
MIL-STD-810H U.S. Department of Defense Test Method Standards

Test Conditions:

Common test  levels

temperature(℃)

low pressure(kPa)

test duration(h)

-55

5

2

-55

15

2

-55

25

2

-55

40

2

-40

55

2或16

-40

70

2或16

-25

55

2或16

40

55

2

55

15

2

55

25

2

55

40

2

55

55

2或16

55

70

2或16

85

5

2

85

15

2

Test Period:
Regular test cycle: test time + 3 working days
The above are working days and do not consider equipment scheduling.

Test Equipment:
Equipment name: low pressure test chamber

Equipment parameters: temperature: (-60 ~ 100) ℃,

Humidity: (20~98)%RH,

Air pressure: normal pressure ~ 0.5kPa,

Rate of temperature change: ≤1.5℃/Min,

Depressurization time: 101Kpa~10Kpa ≤2min,

Size: (1000x1000x1000)mm;

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Post time: May-18-2022